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³ª³ëÅØ SPOES SystemÀº detector ³»ºÎ¿¡ ¼ÒÇü plasma chamber°¡ ÀÖ¾î °øÁ¤ è¹ö·ÎºÎÅÍ À¯ÀÔµÈ gas¸¦ ¹æÀü½Ã۰í, gas ¹æÀü¿¡ ÀÇÇÑ ¹æÃâµÈ ºûÀ» ºÐ±¤±â(Spectrometer)¸¦ ÅëÇØ ¸ð´ÏÅÍ ¹× ºÐ¼®ÇÏ´Â ÀåºñÀÌ´Ù.
SPOES·Î À¯ÀÔµÈ GasÀÇ ¼ººÐ ¹× ¾Ð·Â µîÀÇ º¯È­¿¡ ÀÇÇØ ºûÀÇ ÆÄÀå(Wavelength)Àº º¯È­Çϰí À̸¦ ½Ç½Ã°£À¸·Î ¸ð´ÏÅÍ ÇÔÀ¸·Î½á °øÁ¤»óÀÇ º¯È­¸¦ °¨ÁöÇÒ ¼ö ÀÖ´Ù.

Chamber SPOES ±¸¼º
1 chamber 1controller+1detector
2 chamber 1controller+2detector
3 chamber 1controller+3detector
4 chamber 1controller+4detector
Leak detection
In-situ process monitor
Fault detection
Cleaning/Seasoning optimization


ITEM DESCRIPTIONS
¹æÀü °³½Ã ¾Ð·Â 5mT~3.0T (@fore-line)
ICP plasma source Max. 30W
Optical window Sapphire
CCD sensor 2,048 pixels / 16 bits
Spectral range 200~850nm (UV to NIR)
Spectral resolution <0.5nm
º°µµ pumping ÇÊ¿ä ¾øÀ½
Åë½Å ÇÁ·ÎÅäÄÝ RS232, Digital I/O, SECS
Detectors/Controller Max. 4
Vacuum interface ISO NW16 (Reducer Ȱ¿ë°¡´É)
Power requirement 110/220VAC, 50/60Hz, 3A
¿î¿µ üÁ¦ Window 2000/XP
¿î¿µ ÇÁ·Î±×·¥ AOS (AEGIS Operating Software)
Å©±â Detector 127(W)X65(H)X231(D) [mm]
Controller 380(W)X132.6(H)X253.2(D) [mm]
¹«°Ô Detector ¾à 1.5 [kg]
Controller ¾à 7.1 [kg]